This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...