Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

- This study contributes to the development of nano-scale devices using graphene - Yoshiyuki Miyamoto (Leader), Dynamic Process Simulation Group, the Nanosystem Research Institute (Director: Tomohiko ...

Scientists at Caltech have created a quantum microscope that taps into the quirky quantum rules to see tiny details much more clearly. Using pairs of entangled photons allows the instrument to double ...

Nikon just announced the winners of the 2024 Nikon Small World Photomicrography Competition, where scientific microscope images become art. This year’s top prize went to Bruno Cisterna, who (assisted ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new ...

This picture is composed of 4,225 scanning electron microscope images. It shows a microchip based on 65-nanometre technology. This means that the smallest structure on the chip that can be reliably ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

– Development of technique to directly “observe“ individual atoms of light elements – Kazutomo Suenaga (Prime Senior Researcher) of the Nanomaterials Research Institute (NMRI; Director: Tsuyoshi ...

The audio version of this article is generated by AI-based technology. Mispronunciations can occur. We are working with our partners to continually review and improve the results. A few works from ...